Some typical applications are:
- Raw meal optimization in cement plants (SiO2, CaO and Fe2O3)
- Finished cement analysis (SO3)
- Sb, Br, and Zn in polystyrene pellets
- NaCl in Methyl cellulose
- Fe and K in feldspar
- Catalysts and additives in Polyethylene and Polypropylene (Ti, Ca, Zn)
You present us with the analytical problem and we give you the solutions. SPECTRO offers you a choice of two different analyzers that can be packaged to suit exactly your powder or pellet application.
Gravity Powder Sampler
A measuring head mated to a chamber filled with powder. The chamber is filled, packed by vibration, analyzed, emptied, and then refilled.
Reciprocating-Arm Powder Sampler
A measuring head placed over a moving arm that extends into a product chute to collect a sample.
Gravity Packing, Model 600(T)-G
- Well proven vertical sampler with 40mm diameter sample cell with polished stainless -steel inner surface.
- Proprietary X-ray window designed for long service life.
- Optional window break sensor.
- Optional vibrating sample packing device for reproducible sample density.
- Measuring head mechanically isolated from vibrations.
- Hinged measuring head mounted for quick and easy access to optics.
- Optional analytical purge for improved light element measurements.
- Optional manual check-sample collection assembly.
Reciprocating Arm, Model 600(T)-RA
This configuration employs a novel reciprocating arm to collect samples from a vertical chute with minimal (or no extra) sample handling equipment; coupled with automatic pellet production and "windowless" analysis, the 600T-RA affords unmatched ease and simplicity of on-line analysis.
- Small measuring assembly installs on the side of any suitable chute or air sluice.
- Automatic, motor-driven arm usually does not require pre-sampler.
- Integrated sample cup, sample pellet-press and pneumatic pellet-discharge system for verification.
- Hinged measuring head mounted for quick and easy access to optics.
- The XRF measuring head is isolated from vibration.
- The need for a special beryllium X-ray window is eliminated by the downward facing XRF geometry which improves light element performance and reduces maintenance.
- Optional analytical purge improves light element measurements.