SPECTRO`s stationary X-Ray spectrometers are based on the method of the Energy-Dispersive-X-Ray-Fluorescence analysis (ED-XRF). The atoms in the sample material, which could be any solid, powder or liquid, are excited by X-Rays emitted from a X-Ray tube or radioisotope. For increasing sensitivity the primary excitation radiation can be polarised by using specific targets between the X-Ray tube and the sample (ED-P(olarisation)-XRF). All element specific X-Ray fluorescence signals emitted by the atoms after the photoelectric ionisation are measured simultaneously in a fixed mounted semi-conductor detector or sealed gas-proportional counter.

The radiation intensity of each element signal, which is proportional to the concentration of the element in the sample, is recalculated internally from a stored set of calibration curves and can be shown directly in concentration units.

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